Published: 31 March 2009

The analysis of defects propagation in navigating electronic devices

A. Bogorosh1
S. Voronov2
S. Larkin3
N. Višniakov4
J. Novickij5
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Abstract

Defects in the form of microcracks in ??8?12 contacts of passive electronic components of navigating devices operating at different temperatures and pressure were analyzed. Research results have demonstrated the possibility of early prevention of potential accidents. Microscopic studies are systematized depending on various physical and chemical influences on devices. The mathematical model for defects definition in local points of contacts with an error of about 5 – 7.5 % has been applied

About this article

Received
16 January 2009
Accepted
10 March 2009
Published
31 March 2009
Keywords
defect propagation
cluster
microcrack
grain boundary
navigating electronic devices